'Oh no, they've done it again', cries the chief designer at the Waferland chip factory. Once more the routing designers have screwed up completely, making the signals on the chip connecting the ports of two functional blocks cross each other all over the place. At this late stage of the process, it is too
expensive to redo the routing. Instead, the engineers have to bridge the signals, using the third dimension, so that no two signals cross. However, bridging is a complicated operation, and thus it is desirable to bridge as few signals as possible. The call for a computer program that finds the maximum number of signals which may be connected on the silicon surface without rossing each other, is imminent. Bearing in mind that there may be housands of signal ports at the boundary of a functional block, the problem asks quite a lot of the programmer. Are you up to the task?
Figure 1. To the left: The two blocks' ports and their signal mapping (4,2,6,3,1,5). To the right: At most three signals may be routed on the silicon surface without crossing each other. The dashed signals must be bridged.
A typical situation is schematically depicted in figure 1. The ports of the two functional blocks are numbered from 1 to p, from top to bottom. The signal mapping is described by a permutation of the numbers 1 to p in the form of a list of p unique numbers in the range 1 to p, in which the i:th number pecifies which port on the right side should be connected to the i:th port on the left side.
Two signals cross if and only if the straight lines connecting the two ports of each pair do.
Input
On the first line of the input, there is a single positive integer n, telling the number of test scenarios to follow. Each test scenario begins with a line containing a single positive integer p<40000, the number of ports on the two functional blocks. Then follow p lines, describing the signal mapping: On the i:th line is the port number of the block on the right side which should be connected to the i:th port of the block on the left side.
Output
For each test scenario, output one line containing the maximum number of signals which may be routed on the silicon surface without crossing each other.
Sample Input
4 6 4 2 6 3 1 5 10 2 3 4 5 6 7 8 9 10 1 8 8 7 6 5 4 3 2 1 9 5 8 9 2 3 1 7 4 6
Sample Output
3 9 1 4
题意：给出t表示几组数据,每组数据先给出n后给出n个数，求最长上升子序列的长度。
解题思路：DP
（《挑战程序设计竞赛》P65）
我们利用DP求取针对最末位的元素的最长的子序列。如果子序列相同，那么最末位的元素较小的在之后会更加有优势，所以我们再反过来用DP针对相同长度情况下最小的mo'w末尾元素进行求解。
dp[i]:=长度为i+1的上升子序列中末尾元素的最小值（不存在的话就是INF）
AC代码：
#include<stdio.h>
#include<string.h>
#include<algorithm>
using namespace std;
#define INF 0x3f3f3f3f
int a[40010],dp[40010];
int main()
{
int t,n;
scanf("%d",&t);
while(t--)
{
scanf("%d",&n);
for(int i=0;i<n;i++)
{
scanf("%d",&a[i]);
}
fill(dp,dp+n,INF);
for(int i=0;i<n;i++)
{
*lower_bound(dp,dp+n,a[i])=a[i];
}
printf("%d\n",lower_bound(dp,dp+n,INF)-dp);
}
return 0;
}